Advances of Magnetic Memory Testing Technology

Autor:	Shujun Liu, Ming Jiang, Dean He, Shenglin Li
Rok vydání:	2017
Předmět:	Materials science business.industry Nondestructive testing Electrical engineering Magnetic memory business Stress concentration
Zdroj:	Proceedings of the Second International Conference on Mechanics, Materials and Structural Engineering (ICMMSE 2017).
DOI:	10.2991/icmmse-17.2017.70
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::941c83a852d8ee31d99ce583438dbd2d https://doi.org/10.2991/icmmse-17.2017.70 Zobrazit plný text záznamu