Radiation-induced changes in vanadium speciation in basaltic glasses: Implications for oxybarometry measurements using vanadium K-edge X-ray absorption spectroscopy
| Autor: | Antonio Lanzirotti, Stephen Sutton, Matthew Newville, Elisabet Head |
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| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | American Mineralogist. 107:729-738 |
| ISSN: | 1945-3027 0003-004X |
| DOI: | 10.2138/am-2021-7933 |
| Popis: | Magmatic oxygen fugacity (fO2) exerts a primary control on the discrete vanadium (V) valence states that will exist in quenched melts. Vanadium valence proxies for fO2, measured using X-ray absorption near-edge spectroscopy (XANES), can provide highly sensitive determinations of the redox conditions in basaltic melts. However, X-ray beam-induced changes in V speciation will introduce uncertainty in the calculated average V valence (V*) that must be properly evaluated to make meaningful interpretations of the igneous evolution of the system. The study presented here showed that beam-induced modifications in V speciation are observed in silicate glasses that are dependent on the radiation dose rate used during analysis. Changes in V speciation are observed to be most pronounced at the highest flux density tested, 9.25 × 1011 ph/s/µm2 (photons per second per square micrometer), with rapid changes occurring in the first 200 s of analysis. The high-dose rate conditions result in changes in calculated V* ~0.3 valence unit for the most oxidized glass analyzed (V* = 4.94), which can correspond to ~0.5 log unit reduction in calculated fO2. However, at flux densities ≤1.13 × 109 ph/s/μm2, measured changes in V* were found to be |
| Databáze: | OpenAIRE |
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