FZ crystal growth of monochromator-grade YB66 single crystals as guided by topographic and double-crystal diffraction characterization
| Autor: | Z. U. Rek, Joe Wong, Takaho Tanaka, M. Rowen |
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| Rok vydání: | 1998 |
| Předmět: |
Diffraction
Range (particle radiation) Materials science business.industry Crystal growth Condensed Matter Physics Crystallographic defect Synchrotron Characterization (materials science) law.invention Inorganic Chemistry Optics Reflection (mathematics) law Materials Chemistry business Monochromator |
| Zdroj: | Journal of Crystal Growth. 192:141-151 |
| ISSN: | 0022-0248 |
| DOI: | 10.1016/s0022-0248(98)00400-x |
| Popis: | YB 66 crystals grown with an indirect heating floating zone method were extensively characterized using a variety of X-ray diffraction techniques such as synchrotron white beam transmission and reflection topography, section topography and conventional double-crystal rocking curve measurements using Cu K α and Mg K α sources. The observed crystal defects and deformations were correlated with changes in the crystal growth process. The interplay beween systematic characterization and process improvements results in the growth of high quality single crystals of YB 66 that can be used as an efficient element for monochromatization of synchrotron soft X-ray in the 1–2 keV energy range. |
| Databáze: | OpenAIRE |
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