Sensitivity Patterns for Features of MT Response Functions and Their Application to Inversion

Autor:	J. Uhm, H.J. Lee, J. Lee, Y.H. Son, D. Min
Rok vydání:	2023
Zdroj:	84th EAGE Annual Conference & Exhibition.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::934e2519281ef998e7da639e1d1d1502 https://doi.org/10.3997/2214-4609.202310437 Zobrazit plný text záznamu