In situ characterization of surfaces at high temperature by using simultaneously a pyroreflectometer and an X-ray diffractometer

Autor:	J.M. Gineste, R. Verges, D. Antoine, F. Sibieude, G. Llauro, D. Hernandez
Rok vydání:	1998
Předmět:	In situ Diffraction Optical fiber Chemistry Analytical chemistry General Physics and Astronomy Surfaces and Interfaces General Chemistry Condensed Matter Physics Surfaces Coatings and Films law.invention Characterization (materials science) Crystallography law X-ray crystallography Diffractometer
Zdroj:	Applied Surface Science. 135:91-96
ISSN:	0169-4332
DOI:	10.1016/s0169-4332(98)00260-8
Popis:	An optical fiber pyroreflectometer was adapted to an X-ray diffraction (XRD) high temperature chamber, in order to analyse and control in situ the thermoradiative properties and the temperature of the sample simultaneously examined by XRD. The modifications accompanying the high temperature oxidation of two different materials: TiO 2− x plates and CVD (Ti, Si, N) coatings were chosen as illustrating examples.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::933803411522e7f0f433ff8df0c9cbb5 https://doi.org/10.1016/s0169-4332(98)00260-8 Zobrazit plný text záznamu Full Text from ScienceDirect