| Autor: |
L.F. Wen, Cha-Ming Shen, T.C. Chuang, Shi-Chen Lin, Jon C. Lee, Chen-May Huang |
| Rok vydání: |
2010 |
| Předmět: |
|
| Zdroj: |
International Symposium for Testing and Failure Analysis. |
| ISSN: |
0890-1740 |
| Popis: |
Tiny circuit design reliability issue related to competitive signal was investigated in a sense amplifier (SA) circuitry of SRAM by E-Beam probing technique in this paper. The irregular output signals then traced back to former stage circuit and identified associated waveforms. With such design concept and technique tracing, the invisible and cunning circuit mismatch reliability issue could be revealed successfully. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
|
