Direct measurement of density-of-states effective mass and scattering parameter in transparent conducting oxides using second-order transport phenomena

Autor:	T.J. Coutts, W. P. Mulligan, A. S. Gilmore, David L. Young, V. Kaydanov
Rok vydání:	2000
Předmět:	Materials science Condensed matter physics Scattering Fermi level Fermi energy Surfaces and Interfaces Condensed Matter Physics Boltzmann equation Surfaces Coatings and Films symbols.namesake Effective mass (solid-state physics) symbols Density of states Nernst equation Nernst effect
Zdroj:	Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 18:2978-2985
ISSN:	1520-8559 0734-2101
DOI:	10.1116/1.1290372
Popis:	The Boltzmann transport equation can be solved to give analytical solutions to the resistivity, Hall, Seebeck, and Nernst coefficients. These solutions may be solved simultaneously to give the density-of-states (DOS) effective mass, the Fermi energy relative to either the conduction or valence band, and a scattering parameter that is related to a relaxation time and the Fermi energy. The Nernst coefficient is essential for determining the scattering parameter and, thereby, the effective scattering mechanism(s). The authors constructed equipment to measure these four transport coefficients simultaneously over a temperature range of 30-350 K for thin, semiconducting films deposited on insulating substrates.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::92ec5c9fdc94cafd62c68a0cc8369c7b https://doi.org/10.1116/1.1290372 Zobrazit plný text záznamu