On-wafer Measurements of Responsivity of FET-based subTHz Detectors
| Autor: | Bartlomiej Salski, P. Zagrajek, Matthew F. Bauwens, D. Obrebski, N. S. Barker, Pawel Kopyt, J. Marczewski |
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| Rok vydání: | 2018 |
| Předmět: |
Materials science
business.industry Detector Antenna aperture 020206 networking & telecommunications 02 engineering and technology 021001 nanoscience & nanotechnology Responsivity Nondestructive testing 0202 electrical engineering electronic engineering information engineering Optoelectronics Wafer 0210 nano-technology business Sensitivity (electronics) |
| Zdroj: | 2018 IEEE/MTT-S International Microwave Symposium - IMS. |
| DOI: | 10.1109/mwsym.2018.8439544 |
| Popis: | This article describes a novel approach to measure responsivity of a FET-based sub-THz detector using on-wafer probes to directly feed a bare antenna-less detecting device. Thus, the approach eliminates the need to know beforehand the detector's effective aperture, which can be a source of large variation between responsivity measurements of various FET-based detectors often cited in the literature. It seems that the presented method can be useful at making direct comparisons between responsivity of various devices (e.g. MOSFETs, HEMTs etc.). As a demonstration, the sub-THz responsivity of FET devices fabricated using three different processes has been measured in the WR-3 band and compared. |
| Databáze: | OpenAIRE |
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