Optimized sample preparation procedures for the analysis of solid materials by total-reflection XRF

Autor:	M. Dargie, V. Valkovic, Andrzej Markowicz, Antonella Tajani
Rok vydání:	1997
Předmět:	Total internal reflection Accuracy and precision Chemistry Microwave oven Analytical chemistry Sample preparation Solid material Biochemistry Environmental - origin
Zdroj:	Fresenius' Journal of Analytical Chemistry. 357:589-593
ISSN:	1432-1130 0937-0633
DOI:	10.1007/s002160050219
Popis:	The total reflection X-ray fluorescence (TXRF) method has been used for the analysis of various types of solid materials of biological, geological and environmental origin. The sample preparation step prior to TXRF measurements has been optimized for the various solid samples, including their decomposition by applying both a microwave oven and a PTFE bomb. Complete procedures for the optimized decomposition from the point of view of speed and completeness of digestion, as well as of the overall precision and accuracy are presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9291a9001071dc61832834041c1b749a https://doi.org/10.1007/s002160050219 Zobrazit plný text záznamu Full text from SpringerLink