An Advanced Technique for High Temperature X-Ray Elastic Constant and Stress Investigations

Autor:	Chun Liu, Jean-Lou Lebrun, Francois Sibieude
Rok vydání:	1992
Předmět:	010302 applied physics Stress (mechanics) Materials science 0103 physical sciences X-ray 02 engineering and technology General Medicine Composite material 021001 nanoscience & nanotechnology 0210 nano-technology Constant (mathematics) 01 natural sciences
Zdroj:	Advances in X-ray Analysis. 36:411-422
ISSN:	2631-3626 0376-0308
DOI:	10.1154/s0376030800019030
Popis:	A high temperature in situ X-Tay diffraction (HTXRD) instrument was devised for residual stress (RS) and X-ray elastic constant (XECs) investigations. The aim was to gain a better understanding of the stresses developed during high temperature oxidation, which is essential for the lifetime improvement of refractory alloys. The investigators use sin2ψ method to survey the stress evolution during oxidation in both the scale and the substrate, and differential method to determine the XECs that relate the measured/measurable deformation to the stress state of the materials studied. The stresses on the Ni/NiO system are measured in situ. The XECs are determined on XC75 steel samples. This paper presents the theories of stresses and XECs determined by HTXRD and briefly discusses the experimental results.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9290066c36a165ba38a3db53b2e5d9b4 https://doi.org/10.1154/s0376030800019030 Zobrazit plný text záznamu