Dielectronic-Recombination Cross-Section Measurements forC+Ions

Autor: R. E. Mitchell, J. B. A. Mitchell, J. L. Forand, A. Sen, D. P. Levac, D. B. Miko, C. T. Ng, J. Wm. McGowan
Rok vydání: 1983
Předmět:
Zdroj: Physical Review Letters. 50:335-338
ISSN: 0031-9007
DOI: 10.1103/physrevlett.50.335
Popis: With use of a merged electron-ion beam apparatus, a lower limit of dielectronic recombination cross section for ${\mathrm{C}}^{+}(^{2}P)+e$ has been obtained from 9.04 to 9.32 eV. The measured cross section exceeds the theoretically predicted value by more than a factor of 3. This lies well outside the stated experimental and theoretical uncertainties.
Databáze: OpenAIRE