In-plane X-ray scattering of epitaxial structures
| Autor: | Ming Li, Suxian Cui, Y.T Wang, Yan Zhuang, Z. H. Mai |
|---|---|
| Rok vydání: | 1995 |
| Předmět: |
Diffraction
Materials science Condensed matter physics Scattering business.industry Superlattice X-ray Cleavage (crystal) Heterojunction Condensed Matter Physics Epitaxy Inorganic Chemistry Condensed Matter::Materials Science Optics Condensed Matter::Superconductivity Materials Chemistry business Computer Science::Databases Quantum well |
| Zdroj: | Journal of Crystal Growth. 152:354-358 |
| ISSN: | 0022-0248 |
| Popis: | A new approach for in-plane X-ray scattering from the cleavages of epitaxial films or superlattices, where the scattering vectors are parallel to the interfaces, is proposed. This method can be employed to determine directly the in-plane X-ray strains and other atomic registry along the interfaces of the epitaxial structures. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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