| Autor: |
WF Soh, B.L. Yeoh, S.H. Goh, Y.H. Chan, Li Song, MH Thor |
| Rok vydání: |
2020 |
| Předmět: |
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| Zdroj: |
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). |
| Popis: |
It is a common perception that electrical fault isolation (EFI) is the heart of a successful integrated circuit failure analysis workflow. Much effort to enhance EFI approaches is vested on improving optical resolution and system signal-to-noise in order to meet performance demands of advanced technologies. In fact, pre- and post-EFI data processing procedures are equally important and capable to influence the success of fault localization significantly. We describe three different analytical workflows applied on actual SOC memory failures to demonstrate this importance. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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