Factory-Level Analysis of Additively Manufactured Lattice Structures Using Automated Metrology

Autor:	William P. King, Sameh Tawfick, Chenhui Shao, Hallee Deutchmann, David Pick, Charles Wood, Daniel Baker, Aaron Brenzel, Samuel Rylowicz, Davis McGregor
Rok vydání:	2021
DOI:	10.1115/1.0004211v
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::91d3a67f42145bf873a93d7178bfe544 https://doi.org/10.1115/1.0004211v Zobrazit plný text záznamu