X-ray diffraction studies and dielectric properties of Ni doped Mg ferrites
| Autor: | Pradeep Chavan, L. R. Naik |
|---|---|
| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science Spinel Analytical chemistry 02 engineering and technology Dielectric engineering.material 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Surfaces Coatings and Films Lattice constant Impurity 0103 physical sciences X-ray crystallography engineering Ferrite (magnet) Dielectric loss Crystallite 0210 nano-technology Instrumentation |
| Zdroj: | Vacuum. 152:47-49 |
| ISSN: | 0042-207X |
| DOI: | 10.1016/j.vacuum.2018.03.007 |
| Popis: | The ferrites with general formula NixMg1-xFe2O4 (x varies from 0.0 to 0.5) was synthesized by solid state reaction method. The presence of single phase cubic spinel structure of the ferrites without any impurities was confirmed by powder X-ray diffraction measurement. The crystallite size of ferrite materials was estimated by using Scherer formula and is found to be increased in the range from 0.930 μm to 1.04 μm. The lattice constant of ferrites increases with increase in the concentration of nickel and found in the range from 8.332 A to 8.375 A. To understand the conduction mechanism, AC conductivity was determined from the data of dielectric constant and dielectric loss. The increase of AC conductivity with increase in applied frequency was due to the conduction mechanism of ferrites which can be explained based on the hopping of charge carriers between Fe2+ and Fe3+ on octahedral sites. |
| Databáze: | OpenAIRE |
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