An alternative method to determine the refractive index of AlxGa1−xN
| Autor: | J.A.A. Engelbrecht, M. C. Wagener, Bereneice Sephton, E.G. Minnaar |
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| Rok vydání: | 2016 |
| Předmět: |
010302 applied physics
Alternative methods Materials science business.industry Theoretical models Physics::Optics 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics 01 natural sciences Electronic Optical and Magnetic Materials Wavelength Optics Simple (abstract algebra) 0103 physical sciences Electrical and Electronic Engineering 0210 nano-technology business Refractive index |
| Zdroj: | Physica B: Condensed Matter. 480:181-185 |
| ISSN: | 0921-4526 |
| DOI: | 10.1016/j.physb.2015.08.047 |
| Popis: | Certain characterizations of Al x Ga 1− x N epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of Al x Ga 1− x N is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are compared to the theoretical models, as well as to previously obtained experimental results. Acceptable agreement with both theoretical and experimental values are obtained. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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