Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention

Autor:	Mattia Giulianini, Gerardo Malavena, Luca Chiavarone, Alessandro S. Spinelli, Christian Monzio Compagnoni
Rok vydání:	2023
Zdroj:	2023 IEEE International Reliability Physics Symposium (IRPS).
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::91756ce73d3e69e1271b401518d49e2f https://doi.org/10.1109/irps48203.2023.10117584 Zobrazit plný text záznamu