Moiré Fringe Analysis of BaZrO3Nanorods in ErBa2Cu3O7-δFilms

Autor:	Yuki Shingai, Masashi Mukaida, Yutaka Yoshida, Kaname Matsumoto, Nobuyuki Mori, Ataru Ichinose, Ryusuke Kita, Shigeru Horii, Yoshitsugu Tomokiyo, Shoichi Toh, Kenji Kaneko, Kazuhiro Yamada
Rok vydání:	2007
Předmět:	Diffraction Materials science Physics and Astronomy (miscellaneous) business.industry Doping General Engineering General Physics and Astronomy Microstructure Pulsed laser deposition Lattice constant Optics Transmission electron microscopy Optoelectronics Nanorod Selected area diffraction business
Zdroj:	Japanese Journal of Applied Physics. 46:708-711
ISSN:	1347-4065 0021-4922
Popis:	Microstructures of BaZrO3 (BZO) doped as artificial pinning centers in ErBa2Cu3O7-δ (ErBCO) films were studied by high-resolution transmission electron microscopy (HR-TEM). BZO-doped ErBCO films were grown by a pulsed laser deposition (PLD) method. In the HR-TEM observation, the presence of nanorods with 10 nm average diameter was confirmed from Moire fringe analysis. The lattice constant of nanorods in the ErBCO was measured using a selected area electron diffraction pattern (SAEDP) as 0.416 nm, which was in good agreement with the lattice constant of BZO, 0.419 nm, provided by X-ray diffraction data. Moire fringes were observed in both cross-sectional-view and plan-view of the HR-TEM images. The distances of the Moire fringes were 2.07, 3.22, and 3.05 nm, and which corresponded to the 200, 006, and 110 reflections of the ErBCO matrix and the 200, 002, and 110 reflections of nanorods, respectively. It is suggested that BZO disperses in ErBCO film as nanorods.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::91643edd1c9c573e5da28ded330c5a9b https://doi.org/10.1143/jjap.46.708 Zobrazit plný text záznamu