| Autor: |
Sonia Eloued, Nabil Chouba, Ahmed Fakhfakh |
| Rok vydání: |
2009 |
| Předmět: |
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| Zdroj: |
2009 6th International Multi-Conference on Systems, Signals and Devices. |
| DOI: |
10.1109/ssd.2009.4956815 |
| Popis: |
The test of Analogue and Mixed-Signal (AMS) cores requires the use of expensive AMS testers and accessibility to internal analogue nodes. The test cost can be considerably reduced by the use of Built-In-Self-Test (BIST) techniques. One of these techniques consists in generating analogue test signals from digital test patterns (obtained via ΣΔ modulation) and converting the responses of the analogue modules into digital signatures that are compared with the expected ones. In this paper, we tried to test the efficiency of this technique by associating to the BIST a high level VHDL-AMS description of a ΣΔ modulator. This work details our modeling strategy to obtain a fast and accurate virtual prototype of the modulator. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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