| Autor: |
A.S. Bhattacharyya, R. Dash |
| Rok vydání: |
2022 |
| Zdroj: |
Письма в журнал технической физики. 48:3 |
| ISSN: |
0320-0116 |
| DOI: |
10.21883/pjtf.2022.15.53122.19132 |
| Popis: |
The failure regions during sliding nano indentation of technologically important SiCN thin films resembled geometrical shapes of Lemniscate and cardiod. An adhesive strength of 9 GPa was estimated. The failure followed two different stress regimes, one tangential responsible for the wear and the other axial responsible for the film/substrate adhesion. EDS spectra of the scratched region shown complete adhesive failure. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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