Test techniques for voltage/humidity-induced degradation of thin-film photovoltaic modules

Autor:	R.S. Sugimura, L.C. Wen, R.S. Ross, G.R. Mon
Rok vydání:	1990
Předmět:	Materials science business.industry Photovoltaic system General Engineering Optoelectronics Humidity Degradation (geology) Field tests Thin film business Voltage
Zdroj:	Solar Cells. 28:103-114
ISSN:	0379-6787
DOI:	10.1016/0379-6787(90)90043-5
Popis:	Thin-film photovoltaic modules, deployed world-wide in various applications, experience considerably different levels of environmental and electrical stresses. Test techniques, combining both accelerated and real-time laboratory and outdoor field tests, have been used to develop a proposed qualification test that rapidly assesses the level of susceptibility of a module to voltage/humidity-induced degradation.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9130a3d3210881eee1c84039a10fb4ba https://doi.org/10.1016/0379-6787(90)90043-5 Zobrazit plný text záznamu