VLSI Design and Test View of Computer Security

Autor: Shih-Lien Lu
Rok vydání: 2023
Zdroj: 2023 International VLSI Symposium on Technology, Systems and Applications (VLSI-TSA/VLSI-DAT).
DOI: 10.1109/vlsi-tsa/vlsi-dat57221.2023.10134130
Databáze: OpenAIRE