Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall
Autor: | Roger Proksch, Bruce M. Moskowitz, Sheryl Foss, E. Dan Dahlberg |
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Rok vydání: | 1997 |
Předmět: | |
Zdroj: | Journal of Applied Physics. 81:5032-5034 |
ISSN: | 1089-7550 0021-8979 |
DOI: | 10.1063/1.364500 |
Popis: | Opposite polarity magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model. |
Databáze: | OpenAIRE |
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