Measurement of the effects of the localized field of a magnetic force microscope tip on a 180° domain wall

Autor: Roger Proksch, Bruce M. Moskowitz, Sheryl Foss, E. Dan Dahlberg
Rok vydání: 1997
Předmět:
Zdroj: Journal of Applied Physics. 81:5032-5034
ISSN: 1089-7550
0021-8979
DOI: 10.1063/1.364500
Popis: Opposite polarity magnetic force microscope (MFM) profiles of domain walls (DWs) in magnetite were measured with a commercial MFM tip magnetized in opposite directions perpendicular to the sample surface. The influence of the tip field on a DW resulted in an overall more attractive interaction. The difference between opposite polarity DW profiles provided a qualitative measurement of the reversible changes in DW structure due to the localized field of the MFM tip. The dependence of the measured alteration on tip-sample separation was fit with a power law at different positions across the DW. The rate of decay of the alteration with tip-sample separation, quantified by the exponent of the power law fit, varied across the DW and was much slower than expected from a simple model.
Databáze: OpenAIRE