Effects of air damping in noncontact resonant force microscopy

Autor:	P. Girard, G. Leveque, S. Belaidi, G. Cohen Solal
Rok vydání:	1997
Předmět:	Physics Vibration Cantilever Drag Electrostatic force microscope Magnetic damping Physics::Atomic and Molecular Clusters Damping factor Atomic force acoustic microscopy Mechanics Instrumentation Non-contact atomic force microscopy Computer Science::Other
Zdroj:	Review of Scientific Instruments. 68:4137-4144
ISSN:	1089-7623 0034-6748
DOI:	10.1063/1.1148358
Popis:	The action of viscous forces on the motion of an atomic force microscope cantilever operating in resonant mode in air is modelized. We demonstrate that for most applications, the vibration of a V shaped cantilever in the air can be approximated to a simple damped oscillator. The damping factor is distance dependent and includes terms issued of the interaction of both cantilever and tip with the sample. Expressions for the various damping forces have been derived and related to the geometry of the tip-cantilever system. They lead to an expression which quantifies the variations in oscillation amplitude versus tip sample distance.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::90db03aa8494d76cde4aa62377cfa952 https://doi.org/10.1063/1.1148358 Zobrazit plný text záznamu