Chemical shift measurements of PIXE spectra using a position-sensitive crystal spectrometer

Autor:	Hiromi Hamanaka, Kenichi Hasegawa, A Tonomura, Kuniko Maeda
Rok vydání:	1999
Předmět:	Crystal Nuclear and High Energy Physics Chemical state Proton Chemistry Analytical chemistry Electron shell Proportional counter Instrumentation Particle detector Spectral line Line (formation)
Zdroj:	Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 150:124-128
ISSN:	0168-583X
Popis:	The in-air high-resolution PIXE system composed of a flat analyzing crystal and a position-sensitive proportional counter was applied to measure line shifts of Si Kα and P Kα X-rays from various samples induced by an external proton beam. Line shifts that reflect chemical environments of atoms in target samples were determined with the precision of 0.1 eV. The utility of the method for chemical state analysis of minor elements down to the order of 0.1% was demonstrated.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::90484fad50597b4d61a8ad91c2e27efe https://doi.org/10.1016/s0168-583x(98)00927-6 Zobrazit plný text záznamu Full Text from ScienceDirect