Atomic level stress and light emission of Ce activated SrS thin films

Autor:	William L. Warren, E. Soininen, Karel Vanheusden, D. R. Evans, W. M. Dennis, J. A. Bullington, S.-S. Sun, Carleton H. Seager, David R. Tallant
Rok vydání:	1997
Předmět:	Materials science Photoluminescence Analytical chemistry Physics::Optics General Physics and Astronomy Cathodoluminescence Ion law.invention Condensed Matter::Materials Science Physics::Plasma Physics Sputtering law Light emission Emission spectrum Thin film Electron paramagnetic resonance
Zdroj:	Journal of Applied Physics. 82:1812-1814
ISSN:	1089-7550 0021-8979
DOI:	10.1063/1.366284
Popis:	We find that the Ce3+ ion in polycrystalline sputtered SrS:Ce thin films resides in a distorted octahedral environment, as opposed to the cubic host environment. Using electron paramagnetic resonance and x-ray diffraction analysis, we show that the degree of axial distortion is related to the preferential growth direction of the SrS films. To first order, the blue-emission properties (emission wavelength and decay times) of the SrS:Ce films do not appear to be affected by the amount of distortion in the local Ce3+ environment.
Databáze:	OpenAIRE
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