X-Ray Diffraction Focusing Circle Errors for a PSPC Based System

Autor: E. B. S. Pardue, M. R. James
Rok vydání: 1989
Předmět:
Zdroj: International Conference on Residual Stresses ISBN: 9789401070072
DOI: 10.1007/978-94-009-1143-7_17
Popis: The error in measurement of 2θ when a linear position sensitive proportional counter (PSPC) is not positioned on the focussing circle is investigated. The errors depend both on 2θ and on the ψ tilt used for X-ray residual stress measurement. A simple calculation predicts that the errors are larger for smaller Bragg angles and for negative ψ tilts. A comparison of data from common engineering materials with diffraction peaks between 127° and 156° validated the predicted trends. These results show that errors in peak location for negative ψ tilts, commonly used in the analysis of triaxial stress states, can be very large for 2θ less that 145°.
Databáze: OpenAIRE