A Deep Learning Framework for Removing Bias from Single-Photon Emission Computerized Tomography

Autor:	Josh Jia-Ching Ying, Wan-Ju Yang, Ji Zhang, Yu-Ching Ni, Chia-Yu Lin, Fan-Pin Tseng, Xiaohui Tao
Rok vydání:	2022
Zdroj:	Advanced Data Mining and Applications ISBN: 9783031220630
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::9026823d0b4542f5dcaa031e0d2c414a https://doi.org/10.1007/978-3-031-22064-7_21 Zobrazit plný text záznamu