Focused helium ion beam milling and deposition
| Autor: | Stuart A. Boden, Darren M. Bagnall, Zakaria Moktadir, Harvey N. Rutt, Hiroshi Mizuta |
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| Rok vydání: | 2011 |
| Předmět: |
Materials science
Ion beam Ion beam mixing Graphene Nanotechnology Condensed Matter Physics Focused ion beam Atomic and Molecular Physics and Optics Surfaces Coatings and Films Electronic Optical and Magnetic Materials law.invention Ion beam deposition law Electrical and Electronic Engineering Ion milling machine Electron beam-induced deposition Field ion microscope |
| Zdroj: | Microelectronic Engineering. 88:2452-2455 |
| ISSN: | 0167-9317 |
| DOI: | 10.1016/j.mee.2010.11.041 |
| Popis: | The use of a helium ion microscope with an integrated gas injection system for nanofabrication is explored by demonstrating the milling of fine features into single layered graphene and the controlled deposition of tungsten and platinum wires from gaseous precursors. Using pattern generator software to control the path of the beam, nanoelectronic device designs are transferred directly into graphene. Four point contact designs are also defined on SiO"2/Si surfaces with atomic force microscopy used to characterize the resulting depositions. Although further optimization of the processes is required and questions of beam-induced damage to the delicate graphene lattice are yet to be answered, the helium ion microscope shows potential to go beyond what is possible with Ga^+ focused ion beam technologies in nanoscale device fabrication. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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