Invisible layers in ellipsometry

Autor:	O. M. Getsko, Eugene G. Bortchagovsky
Rok vydání:	1993
Předmět:	Materials science Invisibility business.industry Metals and Alloys Physics::Optics Surfaces and Interfaces Reflectivity Surfaces Coatings and Films Electronic Optical and Magnetic Materials Optics Ellipsometry Materials Chemistry Dielectric function Thin film business Anisotropy Refractive index
Zdroj:	Thin Solid Films. 234:553-556
ISSN:	0040-6090
Popis:	In this paper we discuss the conditions for the invisibility of some layers in ellipsometry. The reason for such invisibility may be anisotropy. In this situation the thin films cannot be observed by changing the incidence angle. To investigate such films we have to change the ambient medium or the spectral area. A number of examples of such layers are presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8fe0696fcdabe19e2bdcebc2b7a1c2f5 https://doi.org/10.1016/0040-6090(93)90330-r Zobrazit plný text záznamu