Insights into the Hydrogen‐Related Mechanism behind Defect Formation during Light‐ and Elevated‐Temperature‐Induced Degradation

Autor:	Lazhar Rachdi, Benjamin Hammann, Wolfram Kwapil, Martin C. Schubert, Florian Schindler
Rok vydání:	2021
Předmět:	Silicon chemistry Hydrogen chemistry.chemical_element Degradation (geology) General Materials Science Condensed Matter Physics Photochemistry Boron Temperature induced Mechanism (sociology)
Zdroj:	physica status solidi (RRL) – Rapid Research Letters. 15:2000584
ISSN:	1862-6270 1862-6254
DOI:	10.1002/pssr.202000584
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8f8e9ad66e0424844c0d0dd2a33a2920 https://doi.org/10.1002/pssr.202000584 Zobrazit plný text záznamu Plný text