An Automated Multi-Modal Serial Sectioning System for Characterization of Grain-Scale Microstructures in Engineering Materials

Autor:	Michael A. Groeber, P. G. Callahan, Adam Shiveley, Jonathan E. Spowart, Michael Chapman, Michael D. Uchic, Megna N. Shah, Michael Scott
Rok vydání:	2012
Předmět:	Modal Materials science Multi-mode optical fiber Scale (ratio) Optical sectioning Mechanical engineering Polishing Hyperspectral imaging Nanotechnology Electron backscatter diffraction Characterization (materials science)
Zdroj:	Proceedings of the 1st International Conference on 3D Materials Science ISBN: 9783319485737 1st International Conference on 3D Materials Science
DOI:	10.1007/978-3-319-48762-5_30
Popis:	This paper describes the development of a new serial sectioning system that has been designed to collect microstructural, crystallographic, and chemical information from volumes in excess of 1 mm3. The system integrates a robotic multi-platen mechanical polishing system with a modern SEM that enables the acquisition of multi-modal data—scanning electron images, EBSD and hyperspectral EDS map—at each section. Selected details of the system construction as well as an initial demonstration of the system capabilities are presented.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8f74d0b294bc148118b6c98fd0d966f5 https://doi.org/10.1007/978-3-319-48762-5_30 Zobrazit plný text záznamu