Object localization using the statistical behavior of volume speckle fields
| Autor: | Timothy Joseph T. Abregana, Percival F. Almoro |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Wavefront
Physics business.industry Astrophysics::Instrumentation and Methods for Astrophysics General Engineering Holography Physics::Optics Speckle noise 02 engineering and technology 01 natural sciences Atomic and Molecular Physics and Optics law.invention 010309 optics Speckle pattern 020210 optoelectronics & photonics law Electronic speckle pattern interferometry 0103 physical sciences Metric (mathematics) 0202 electrical engineering electronic engineering information engineering Computer vision Artificial intelligence business Image gradient Digital holography |
| Zdroj: | Optical Engineering. 55:121720 |
| ISSN: | 0091-3286 |
| Popis: | Speckle noise presents challenges in object localization using reconstructed wavefronts. Here, a technique for axial localization of rough test objects based on a statistical algorithm that processes volume speckle fields is demonstrated numerically and experimentally. The algorithm utilizes the standard deviation of phase difference maps as a metric to characterize the object wavefront at different axial locations. Compared with an amplitude-based localization method utilizing energy of image gradient, the technique is shown to be robust against speckle noise. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|