Measurement of thickness and roughness using gwyddion
| Autor: | Uttara Kumari M, Satheesh Babu G, Yadhuraj S.R |
|---|---|
| Rok vydání: | 2016 |
| Předmět: |
Measure (data warehouse)
Computer science business.industry Resolution (electron density) 02 engineering and technology Surface finish 021001 nanoscience & nanotechnology 01 natural sciences 010309 optics Scanning probe microscopy Software 0103 physical sciences Thin film 0210 nano-technology business Remote sensing |
| Zdroj: | 2016 3rd International Conference on Advanced Computing and Communication Systems (ICACCS). |
| DOI: | 10.1109/icaccs.2016.7586314 |
| Popis: | The measurement of thickness and roughness parameters are prime importance in thin film technologies and SPM (Scanning Probe Microscopy) based measurements. Unfortunately data processing is neglected compared to the importance given to the scanning of the data. Many inbuilt softwares are made available to the user which are complex and need expertise user. In this regards gwyddion provides the user friendly and open sources software available for data processing and statistical analysis of the sampled data obtained from SPM measurements. In this work the SPM data are obtained through the database and its morphologies and meteorology are studied using gwyddion software. The results obtained shows software could able to detect with the resolution of nanometers and the software can be used to measure the thickness and roughness measurements with reliable accuracy. |
| Databáze: | OpenAIRE |
| Externí odkaz: |
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