Nanohenry inductance measurement using a low parasitic-inductance probe
| Autor: | Tatsuya Nagata, Atsushi Nakamura, Hiroya Shimizu |
|---|---|
| Rok vydání: | 1996 |
| Předmět: |
Leakage inductance
Measurement method Computer Networks and Communications Computer science business.industry Equivalent series inductance Electrical engineering General Physics and Astronomy Noise (electronics) Inductance Parasitic element LCR meter High spatial resolution Electronic engineering Electrical and Electronic Engineering business |
| Zdroj: | Electronics and Communications in Japan (Part II: Electronics). 79:95-102 |
| ISSN: | 1520-6432 8756-663X |
| Popis: | The increased speeds of logic circuitry make the electrical characteristics of LSI packages more important. This is especially true of inductance, which is the main source of simultaneous switching noise (SSN). To improve the accuracy of SSN simulations, inductance models of LSI packages should be represented by inductance matrices; and, thus, to construct precise models, it is necessary to have an inductance measurement method. A new inductance measurement method of nanohenry-order accuracy is proposed that uses an LCR-meter. Since the parasitic inductance of measurement probes usually decreases accuracy, a special probe with minimized parasitic inductance was developed. The new measurement method has the additional advantage of high spatial resolution. The results of measurements proved to be in good agreement with calculations. |
| Databáze: | OpenAIRE |
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