On Regulation Accuracy of Current and Voltage Discrete Values in Testing Facilities of Semiconductor Devices
| Autor: | S. N. Antonov, S. V. Oskin, S. V. Anikuev, V. A. Yarosh |
|---|---|
| Rok vydání: | 2022 |
| Předmět: | |
| Zdroj: | Russian Electrical Engineering. 93:435-437 |
| ISSN: | 1934-8010 1068-3712 |
| DOI: | 10.3103/s1068371222070033 |
| Databáze: | OpenAIRE |
| Externí odkaz: |
|
Full text from SpringerLink