Surface Characteristics of Epitaxial Sr2FeMoO6 Thin Films
| Autor: | Hidefumi Asano, N. Koduka, K. Imaeda, Masaaki Matsui, Y. Takahashi |
|---|---|
| Rok vydání: | 2006 |
| Předmět: |
Surface (mathematics)
Materials science Photoemission spectroscopy Atomic force microscopy Analytical chemistry Condensed Matter Physics Epitaxy Spectral line Electronic Optical and Magnetic Materials Metal X-ray photoelectron spectroscopy visual_art visual_art.visual_art_medium Electrical and Electronic Engineering Thin film Instrumentation |
| Zdroj: | Journal of the Magnetics Society of Japan. 30:374-377 |
| ISSN: | 0285-0192 |
| DOI: | 10.3379/jmsjmag.30.374 |
| Popis: | Thin films of ordered double perovskite Sr2FeMoO6 were sputter-deposited on Ba0.4Sr0.6TiO3-buffered SrTiO3 substrates, and their surface properties were examined by atomic force microscopy (AFM) and X-ray photoemission spectroscopy (XPS). The Mo 3d spectra of Sr2FeMoO6 films showed a multiple peak structure, which originated from the unusual electronic state of metallic Sr2FeMoO6. Systematic XPS studies of the air-exposed surface of Sr2FeMoO6 film indicated that the surface native barrier was an insulating SrMoO4. In addition, a TMR junction with the native barrier was fabricated using a convention photolithographic technique, and an MR ratio of 10 % was observed at 4.2 K. |
| Databáze: | OpenAIRE |
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