PC-Based Management and Analysis of X-Ray Residual Stress Data

Autor:	R. W. Hendricks, S. B. Courtney, M. J. Tricard
Rok vydání:	1992
Předmět:	Materials science Residual stress X-ray Analytical chemistry General Medicine
Zdroj:	Advances in X-ray Analysis. 36:535-541
ISSN:	2631-3626 0376-0308
DOI:	10.1154/s0376030800019169
Popis:	The authors have developed two independent software packages that store x-ray peak locations, integrated intensities and full-width half-maximum intensity data as a function of diffractometer tilt and orientation angle; this information is used to compute residual stress tensor values. Each program retrieves the fitted x-ray peak locations from a dBASE-compatible data set that is independent of both x-ray diffractometer and acquisition software. Machine-specific routines have been coded to transfer peak data and general diffraction setup information from several different x-ray acquisition platforms into this common format. The two database management programs provide stand-alone storage, retrieval, analysis and graphic output of data, and thus have become practical laboratory vehicles toward establishing a standard database format for storing x-ray strain measurements and the residual stress values calculated therefrom.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8e78975454946023f0e0a970038ce746 https://doi.org/10.1154/s0376030800019169 Zobrazit plný text záznamu