| Autor: |
Qiao Yun Sun, Wen Qing Yao, Ming Yu Jia, Xiu Yun Yang |
| Rok vydání: |
2014 |
| Předmět: |
|
| Zdroj: |
Advanced Materials Research. :1009-1013 |
| ISSN: |
1662-8985 |
| DOI: |
10.4028/www.scientific.net/amr.915-916.1009 |
| Popis: |
The Kovar alloy leads broke from two integrated circuits (ICs) with TO (Tin Outline) package. Through the metallurgical microstructure analysis, energy dispersive spectrometer (EDS) analysis and fractography analysis, the failure mode of the leads was found to be stress-corrosion-cracking. After checking the whole plating process, it was found that the residual chloride ions resulted in stress-corrosion-cracking. The chloride ions were absorbed inside the residual organic containment below Ni-plating layer. And a corrective measure was proposed. |
| Databáze: |
OpenAIRE |
| Externí odkaz: |
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