Depth Dependence of the Photoelectron Emission Profile for Cathode Lens Microscopy

Autor:	Chun-I Lu, Chien-Chen Kuo, Yen Huang, Deng-Sung Lin, Der-Hsin Wei, Tzu-Hung Chuang, Chih-Heng Huang
Rok vydání:	2018
Předmět:	010302 applied physics Materials science business.industry 02 engineering and technology Depth dependence 021001 nanoscience & nanotechnology 01 natural sciences Optics Cathode lens 0103 physical sciences Microscopy 0210 nano-technology business Instrumentation
Zdroj:	Microscopy and Microanalysis. 24:156-157
ISSN:	1435-8115 1431-9276
DOI:	10.1017/s1431927618013168
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8e0ae7e0eb6eb7f48cb0a2468dbf7b10 https://doi.org/10.1017/s1431927618013168 Zobrazit plný text záznamu