Temperature test comparison of GaN devices under different light source responses based on thermoreflectance thermography
| Autor: | Zhiwei Zha, Jianyuan Zhu, Xiaofeng Yang, Xu Huang, Huaixin Guo, An Xie, Xiangjun Lu, Zhiwei Fu |
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| Rok vydání: | 2022 |
| Zdroj: | 2022 23rd International Conference on Electronic Packaging Technology (ICEPT). |
| DOI: | 10.1109/icept56209.2022.9872740 |
| Databáze: | OpenAIRE |
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