Current filamentation caused by dynamic avalanche during turn-off transient under short-circuit operation of IGBTs

Autor: T. Matsudai, T. Ogura, T. Suwa, T. Kobayashi
Rok vydání: 2014
Předmět:
Zdroj: Extended Abstracts of the 2014 International Conference on Solid State Devices and Materials.
Databáze: OpenAIRE