X-ray reflectivity studies of the surface structure of liquid metals

Autor:	Moshe Deutsch, M. J. Regan, N. Maskil, K. Penanen, E. H. Kawamoto, Sangyoub Lee, Peter S. Pershan, Ben Ocko, Lonny E. Berman, Olaf M. Magnussen
Rok vydání:	1996
Předmět:	Materials science Analytical chemistry chemistry.chemical_element Penetration (firestop) Condensed Matter Physics Electronic Optical and Magnetic Materials X-ray reflectivity chemistry Monolayer Surface structure Wave vector Electrical and Electronic Engineering Exponential decay Gallium Layering
Zdroj:	Physica B: Condensed Matter. 221:257-260
ISSN:	0921-4526
DOI:	10.1016/0921-4526(95)00935-3
Popis:	Extensive theoretical predictions of atomic layering at the surfaces of liquid metals have remained unconfirmed due to the limited range of wave vector transfer qz that has been previously measured. We report here on X-ray reflectivity studies from the surfaces of liquid mercury to qz greater-than or equivalent to 2.8 A−1, and gallium to qz greater-than or equivalent to 3.0 A−1, that show peaks which clearly demonstrate atomic layering with spacing on the order of the atomic diameter. The exponential decay of layer penetration into the bulk for Ga (6.5 A) is larger than for Hg (3–3.5 A). The prominent features of the layering remain unchanged under self-assembled monolayers of thiols. The Ga layering shows an unexpected strong temperature dependence. Differences between the reflectivity from Ga and Hg at small qz indicate fundamental differences in the surface structure for these two liquid metals.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8d384ff3c7ccdc04ab3499de881cefe0 https://doi.org/10.1016/0921-4526(95)00935-3 Zobrazit plný text záznamu Full Text from ScienceDirect