Voltage noise and jitter analysis for swept source optical coherence tomography using KTa1−Nb O3 deflector
| Autor: | Masahiro Ueno, Mitsuru Shinagawa, Kazuma Endo, Chen Mingchen, Hiroshi Sunaga, Takafumi Ogawa, Yuzo Sasaki, Seiji Toyoda, Tadashi Sakamoto |
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| Rok vydání: | 2019 |
| Předmět: |
Point spread function
Hardware_PERFORMANCEANDRELIABILITY 02 engineering and technology 01 natural sciences Optics Quality (physics) Optical coherence tomography Interference (communication) Hardware_INTEGRATEDCIRCUITS 0202 electrical engineering electronic engineering information engineering medicine Waveform Electrical and Electronic Engineering Instrumentation Jitter Physics medicine.diagnostic_test business.industry Applied Mathematics 020208 electrical & electronic engineering 010401 analytical chemistry Condensed Matter Physics 0104 chemical sciences Tomographic image Voltage noise business |
| Zdroj: | Measurement. 135:753-761 |
| ISSN: | 0263-2241 |
| Popis: | This paper describes voltage noise and jitter analysis for the depth deviation of a point spread function in a swept source optical coherence tomography system using a KTa1-xNbxO3 deflector. An interference waveform with voltage noise and jitter was simulated according to a previous report. Typical values for the voltage noise ΔVTYP and jitter ΔtTYP were also obtained from a previous report and experiment. It was determined that the depth deviation is limited by the ΔtTYP of the system. Therefore, the quality of the tomographic image can be efficiently improved by reducing jitter. |
| Databáze: | OpenAIRE |
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