Parameters Measurements of Semimagnetic Semiconductors by Means of the Electron Paramagnetic Resonance Method

Autor:	S. Yu. Karelin
Rok vydání:	2003
Předmět:	Electron nuclear double resonance Materials science Nuclear magnetic resonance Semiconductor Pulsed EPR business.industry law Electrical and Electronic Engineering business Electron paramagnetic resonance law.invention
Zdroj:	Telecommunications and Radio Engineering. 60:117-126
ISSN:	0040-2508
DOI:	10.1615/telecomradeng.v60.i56.140
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8d131c20ac15bd249f3211751e0e8d21 https://doi.org/10.1615/telecomradeng.v60.i56.140 Zobrazit plný text záznamu