Analysis of Back-Contact Interface Recombination in Thin-Film Solar Cells
| Autor: | Zhibo Zhao, Sachit Grover, Brian Keyes, Feng Liao, Ingrid Repins, Miguel A. Contreras, Rommel Noufi, Kannan Ramanathan, Sanjoy Paul, Jian V. Li |
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| Rok vydání: | 2018 |
| Předmět: |
010302 applied physics
Materials science business.industry Open-circuit voltage 02 engineering and technology 021001 nanoscience & nanotechnology Condensed Matter Physics Solar energy 01 natural sciences Capacitance Electronic Optical and Magnetic Materials law.invention Light intensity law Photovoltaics 0103 physical sciences Solar cell Optoelectronics Electrical and Electronic Engineering 0210 nano-technology business Recombination Excitation |
| Zdroj: | IEEE Journal of Photovoltaics. 8:871-878 |
| ISSN: | 2156-3403 2156-3381 |
| Popis: | The open-circuit voltage ( V OC) in a generic TCO/buffer/absorber/back-contact thin-film solar cell device is a key parameter in the recombination analysis. In particular, V OC is sensitively influenced by the interface recombination at the buffer/absorber front interface and at the absorber/back-contact interface. This paper reports the temperature, excitation light intensity, and wavelength-dependent open-circuit voltage analysis to separate and quantify recombination rates in solar cells at the front and back interfaces, in the depletion regions, and in the quasi-neutral region. The wavelength-dependent V OC analysis is exploited to extract the absorber/back-contact recombination coefficient. The experimentally observed results are verified using SCAPS-1D (one dimensional—a solar cell capacitance simulator) simulation. |
| Databáze: | OpenAIRE |
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