Double-pulsed-carrier speckle-shearing pattern interferometry for transient deformation analysis

Autor:	A. Dávila, José L. Fernández, Jesus Blanco-Garcia, Ángel F. Doval, Carlos Perez-Lopez, Antonio Fernández
Rok vydání:	1998
Předmět:	Shearing (physics) Materials science business.industry Astrophysics::Instrumentation and Methods for Astrophysics Physics::Optics Curvature Laser law.invention Interferometry Speckle pattern Optics law Electronic speckle pattern interferometry business Linear phase Optical path length
Zdroj:	SPIE Proceedings.
ISSN:	0277-786X
DOI:	10.1117/12.312955
Popis:	We report on a novel technique for the evaluation of transient phase in double-pulsed electronic speckle-shearing pattern interferometry. Our technique requires the acquisition of just two speckle-shear interferograms which are correlated by subtraction to obtain a fringe pattern. A spatial carrier is generated by means of an original optical setup based on the separation and later recombination of the two beams produced by a Nd:YAG twin pulsed laser. One introduces an optical path difference in the curvature radii of the illumination beams by mismatching the distances from two diverging lenses to a beam combiner. This procedure gives rise to a linear phase term in the second speckle- shear interferogram that plays the role of a spatial carrier and allows the use of spatial phase measurement methods to analyze the fringe pattern. We present the theoretical aspects of the technique as well as its experimental implementation.
Databáze:	OpenAIRE
Externí odkaz:	https://explore.openaire.eu/search/publication?articleId=doi_________::8ce8ecf80367f8f6ac2f517c29c85dba https://doi.org/10.1117/12.312955 Zobrazit plný text záznamu