A Review of the Characterization Techniques for the Analysis of Etch Processed Surfaces of HgCdTe and Related Compounds
| Autor: | K. Brogden, C. M. Lennon, P. J. Smith, N. Supola, R. N. Jacobs, Patrick Maloney, Andrew J. Stoltz, M. Jaime-Vasquez, Alexander Brown, J. D. Benson, L. A. Almeida, J. K. Markunas |
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| Rok vydání: | 2014 |
| Předmět: |
Materials science
business.industry Sensing applications Material system Condensed Matter Physics Cadmium telluride photovoltaics Electronic Optical and Magnetic Materials Characterization (materials science) High surface Materials Chemistry Surface roughness Optoelectronics Electrical and Electronic Engineering business Surface reconstruction |
| Zdroj: | Journal of Electronic Materials. 43:3708-3717 |
| ISSN: | 1543-186X 0361-5235 |
| Popis: | HgCdTe is the material system of choice for many infrared sensing applications. Growth of this material can often be challenging. However, processing of this material system can be equally as challenging. Incorrect processing can cause shunting, surface inversion, or high surface recombination velocities that can be detrimental. In order to produce an effective device in HgCdTe, one needs to understand what happens to the HgCdTe surface. Factors like the chemical termination of the HgCdTe surface, surface roughness, and surface reconstruction after a process is performed can dramatically affect the performance of devices made with HgCdTe. We will review different surface characterization techniques and how these techniques can be used conventionally and unconventionally, and how different processes can affect the surfaces of HgCdTe and related compounds. |
| Databáze: | OpenAIRE |
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