Optical properties of multilayers composed of silver and dielectric materials

Autor: Hisashi Ohsaki, Yuko Tachibana, Kouji Kusunoki, Toshiya Watanabe, Kazuhito Hashimoto
Rok vydání: 2003
Předmět:
Zdroj: Thin Solid Films. 442:212-216
ISSN: 0040-6090
DOI: 10.1016/s0040-6090(03)00984-2
Popis: We investigated the optical properties of the silver/dielectric-material multilayers and found that the absorption exists at the silver/dielectric-material interfaces. The absorption was assigned to the absorption of surface plasmon by spectral and ellipsometric analysis and X-ray photoelectron spectroscopy (XPS). The absorption was detected as the difference between the measured transmittance and the calculated one with using the optical constants of constituent layers. The absorption increases with the number of the silver/dielectric-material interfaces and with the dielectric constant of the dielectric materials. By considering the absorbing layer at the silver/dielectric-material interface, the ellipsometric analysis gives a good fit of the optical constants and thicknesses of constituent layers and the measured transmittance agrees well with the calculated one using the ellipsometrically obtained results. XPS analysis showed that the resonant energy of the surface plasmon, excited inside the silver layer but in the vicinity of the silver/dielectric-material interface, decreases with the increase of the thickness of the dielectric material and with the increase of the dielectric constant of the dielectric material. This energy shift of the surface plasmon is consistent with the optical absorption measured.
Databáze: OpenAIRE