Characterization of the effects of silicon on the formation of goethite
| Autor: | J.A. Mejía Gómez, E. De Grave, J. Antonissen, V.G. de Resende |
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| Rok vydání: | 2011 |
| Předmět: |
Aqueous solution
Materials science Goethite Silicon General Chemical Engineering Analytical chemistry chemistry.chemical_element Sodium silicate General Chemistry Mass spectrometry chemistry.chemical_compound chemistry visual_art visual_art.visual_art_medium General Materials Science Spectroscopy Inductively coupled plasma mass spectrometry Mossbauer spectrometry |
| Zdroj: | Corrosion Science. 53:1756-1761 |
| ISSN: | 0010-938X |
| Popis: | Goethite samples were synthesised with different sodium silicate concentrations (0, 10−5, 10−4, 10−3 and 10−2 M) in the initial aqueous solution. X-ray diffraction (XRD), Mossbauer spectrometry, inductively coupled plasma mass spectrometry (ICP-MS) and transmission electron microscopy (TEM) were used to investigate the influence of Si content on the formation and physical characteristics of goethite. Mossbauer spectroscopy and TEM results demonstrate that the particle size changes as the sodium silicate content increases. XRD results (lattice parameters, line width and mean coherence length values) do not show any indication that Si species would substitute for Fe in the goethite structure. |
| Databáze: | OpenAIRE |
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